Features

Nano-scaled materials are driving the current technological breakthroughs and their observation and analysis is facilitated by a new and innovative SEM, JSM-IT700HR.
Its new electron gun with spatial resolution of 1 nm and the largest probe current of 300 nA, combined with an exceptionally userfriendly software interface significantly simplifies observation and analysis in SEM.
The compact instrument design also features a large specimen chamber with multiple accessory ports as well as EDS integration.
JSM-IT700HR Advanced SEM, Powerful and Simple to Use.

Introduction

Zeromag & Autofunctions

Magnify optical image, seamleass transition to the SEM image

Zeromag is designed to link the holder graphic or optical image^※ with the SEM image.
Using Zeromag, field searching is easy.

• Stage Navigation System (SNS) is necessary to display an optical image.

Integrated EDS & Live Analysis

Integration of observation and analysis

EDS analysis directly on the SEM observation screen for seamless transition from observation to analysis. Moreover, Live Analysis provides real-time monitoring of the spectra for characteristic X-rays.

SMILE VIEW™ Lab

Fast and flexible report generation

SMILE VIEW™ Lab is a JEOL original data management tool, which links the optical image, SEM image and EDS analysis results.
With one click, a report can be generated easily after the measurement   .
An off-line version of the software^*1 is available to free up the SEM and enhance productivity.

• Off-line data analysis software (option) is required.
• Need to install Microsoft®Office.

Display the depth of signal

A new function for displaying the generation depth of signal is built-in. Observing the analysis depth on the specimen is very effective for understanding the elemental results generated.

Auto Beam Alignment (ABA)

This function automatically adjusts the optical axis of the electron beam.

Large area observation and analysis with montage function

Montage result: 6×6 (Left: Backscattered electron image Right: Cu element map)
Specimen: Flat milled section of brass screw^※, Accelerating voltage: 20 kV, Low vaccum mode (20 Pa), Imaging area: 6.4 mm × 4.8 mm

• Flat milling fabriation was performed by IB-19530CP after mechanical polishing.

Montage is a function to connect all images in a large area as one high-definition image.
This function is very useful for acquiring detailed information over a large area.

Expanding the microscopic world through JSM-IT700HR

Nanomaterials

Carbon nanotube

Accelerating voltage: 2 kV, Signal: Secondary electrons,
Magnification: ×100,000
Observation at low accelerating voltage clearly reveals the surface structure.

Accelerating voltage: 10 kV, Signal: Secondary electrons (left), Backscattered electrons (right), Magnification: ×100,000

Electronic products

Fractured surface of ceramic capacitor

Accelerating voltage: 5 kV, Signal: Backscattered electrons,
Magnification: ×1,000 (left) ×10,000 (right)

CP-milled section of semiconductor SRAM

Accelerating voltage: 5 kV, Signal: Backscattered electrons, Magnification: ×60,000 (left, right)

CP is an instrument for preparing a cross section of a specimen using a broad Ar ionbeam and shield plate. In recent years, CP has been widely used to prepare cross sections of metal, ceramics, plastic,and other materials.

Metals

Large area montage analysis

Fracture surface of stainless

Accelerating voltage: 15 kV, Signal: Secondary electrons,
Magnification: ×500, Montage result: 13×6
By observing the entire area of a fracture surface, a detailed analysis of the fracture mechanism can be made. In this specimen, typical fatigue failure, such as the striation pattern and dimple microvoids, are observed.

*Elemental analysis: EDS map*

CP-milled section of precision cutting blade

Accelerating voltage: 15 kV, Signal: Backscattered electrons (left) EDS map (right), Magnification: ×3,000
Using overlay map, the distribution of heavy metal elements in the precision cutting blade is made clear.

*High magnification EBSD analysis*

CP-milled section of stainless wire along the longitudinal direction

Image Quality Map(left), Phase map image(right)

*Image Quality Map(left), Phase map image(right)*

EBSD map image
(direction: Direction 3)

Accelerating voltage: 10 kV, Probe current: 5 nA, Magnification: ×10,000

Soft materials

Carbon black in the rubber

Accelerating voltage: 15 kV
Signal: Secondary electrons
Magnification: ×20,000

Plastic glove

Accelerating voltage: 5 kV,
Signal: Low vacuum backscattered electrons
Magnification: ×30,000

Membrane on a chicken eggshell

Accelerating voltage: 5 kV,
Signal: Low-vacuum secondary electrons
Magnification: ×500

Low-vacuum mode

Low vacuum mode allows for observation of non-conductive materials without treatment. Evacuation at the objective lens improves image quality in low vacuum mode.

Food

Ice cream

Accelerating voltage: 7 kV, Signal: Low vacuum backscattered electrons, Magnification: ×300 (left) ×30,000 (right)

Fat globules and muscle fiber of chicken

Accelerating voltage: 10 kV
Signal: Low-vacuum backscattered electrons
Magnification: ×300

LV cryo-holder*1

LV cryo-holder keeps a specimen frozen without water loss.
A hydrous specimen like food can be observed. It is possible to visualize the texture by understanding the size of ice and the diameter of muscle fibers.
*1 Optional

Biology

E. coli and T4 phage

Accelerating volage: 2.5 kV
Signal: Secondary electrons
Magnification: ×25,000

Accelerating volage: 2.5 kV
Signal: Secondary electrons
Magnification: ×80,000