Scanning Electron Microscope, กล้องจุลทรรศน์อิเล็กตรอนแบบส่องกราด เรียกย่อๆว่า SEM
เป็นกล้องจุลทรรศน์ที่ใช้ศึกษาพื้นผิวของตัวอย่าง โดยเฉพาะศึกษาลักษณะสัณฐานวิทยาเช่น ลักษณะรูปร่าง
ลวดลายเป็นผิวตัวอย่างตลอดจนขนาดของตัวอย่างโดยล าอิเล็กตรอนจะส่องกราดไปบนผิวของวัตถุ และสามารถศึกษาทั้ง
ตัวอย่างทางชีวภาพและวัสดุศาสตร์อีกด้วย ได้ภาพมีลักษณะเป็นภาพ 3 มิต

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JEOL : JCM-7000 NeoScope™ Benchtop Scanning Electron Microscope

Optical Image to SEM observation with live Elemental Analysis JCM-7000 is a new benchtop scanning electron microscope with helpful functions.  Low vacuum (LV) mode makes it possible to observe without sample preparation.  Stage Navigation System helps users easily look for the area of interest.  Zeromag provides smooth transition from optical images to SEM images.  Live Analysis enables real-time elemental analysis during observation.  Furthermore, Live 3D gives 3D image restructure simultaneously with the SEM image.  JCM-7000 has incorporated those new functions aiming at “observations and analyses by everyone”. ● Direct magnification: ×10 to ×1,000,000 (Magnification is defined by 128 mm × 96 mm) ● Monitor magnification: ×24 to ×202,168 (Magnification is defined by 280 mm × 210 mm) ● Specimen size: 80 mm diameter ● Main options: EDS (energy dispersive X-ray spectrometer), Stage Navigation System, Tilting and Rotating Motor Drive Holder

Scanning Electron Microscope JEOL JSM-IT200 InTouchScope™

JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput.

Scanning Electron Microscope JEOL JSM-IT210

The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to use. In addition, the newly equipped "Simple SEM" automatically acquires observation and analysis by simply selecting the field of view. The JSM-IT210 is a new generation SEM that is compact and can be operated unattended.

Scanning Electron Microscope JEOL JSM-IT510 InTouchScope™

With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier.

Scanning Electron Microscope JEOL JSM-IT710HR

Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR* series, which is based on the theme of "SEM that allows anyone to easily take high-resolution images. The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector.

Scanning Electron Microscope JEOL JSM-IT800 Schottky Field Emission

The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" for fast elemental mapping with a fully embedded JEOL energy dispersive X-ray spectrometer (EDS), as a common platform.