Jeol
Analytical Electron Microscope JEOL JEM-ARM200F NEOARM Atomic Resolution
"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.
Atomic Resolution Analytical Microscope JEOL JEM-ARM300F2 GRAND ARM™2
The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.
Electron Probe Microanalyzer JEOL JXA-iSP100
Electron Probe Microanalyzer (EPMA) has been utilized as a tool for research development and quality assurance in a variety of industrial fields such as steel, automobile, electric component, battery material and its application are expanding more and more. In addition, in academic fields, EMPA has been widely used in earth planetary science and material science, and the future contribution can be expected to applications including various advanced researches covering material energy research such as minerals and various new materials. In response, “simpler” and “faster” use of instrument, accessible to anyone is in demand while maintaining the high performance of microanalysis.
JXA-iHP200F and JXA-iSP100 are integrated EPMAs with enhanced features, satisfying these needs and achieving more efficient operations from observation to analysis.
Field Emission Electron Microscope JEOL JEM-2200FS
The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons is eliminated, resulting in clear images with high contrast. And energy-filtered images forming with electrons at low loss or core loss energy provide chemical state or elemental information of a sample. Also, spectroscopy for elemental analysis and chemical analysis of specimens is available.
Flash Electron Microscope JEOL JEM-1400
The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens including macro-molecular materials, medicines, pathological sections and viruses, usually the entire view of tissues, structures, target locations and observation area are first confirmed at low magnification, and then fine structures of interest are carefully studied at high magnification. To smoothly proceed to this series of observation, recent demands for easier observation steps to acquire higher-throughput image data are increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function.
High Throughput Analytical Electron Microscope JEOL JEM-ACE200F
The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow.
Since the JEM-ACE200F inherits hardware technologies of the JEM-ARM200F high-end TEM and the JEM-F200 multi-purpose FE-TEM, this new high throughput analytical electron microscope provides superbly high stability and analytical capabilities with a renewed sophisticated exterior design.
JEOL : JCM-7000 NeoScope™ Benchtop Scanning Electron Microscope
Optical Image to SEM observation with live Elemental Analysis
JCM-7000 is a new benchtop scanning electron microscope with helpful functions. Low vacuum (LV) mode makes it possible to observe without sample preparation. Stage Navigation System helps users easily look for the area of interest. Zeromag provides smooth transition from optical images to SEM images. Live Analysis enables real-time elemental analysis during observation. Furthermore, Live 3D gives 3D image restructure simultaneously with the SEM image. JCM-7000 has incorporated those new functions aiming at “observations and analyses by everyone”.
● Direct magnification: ×10 to ×1,000,000 (Magnification is defined by 128 mm × 96 mm)
● Monitor magnification: ×24 to ×202,168 (Magnification is defined by 280 mm × 210 mm)
● Specimen size: 80 mm diameter
● Main options: EDS (energy dispersive X-ray spectrometer), Stage Navigation System, Tilting and Rotating Motor Drive Holder
JEOL JEM-120i Electron Microscope
It is a Useful Tool for Every User!
Transmission Electron Microscopes(TEM) with 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We newly developed JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a useful tool that anyone can use easily, from operation to maintenance.
