Jeol
Scanning Electron Microscope JEOL JSM-IT210
The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to use. In addition, the newly equipped "Simple SEM" automatically acquires observation and analysis by simply selecting the field of view. The JSM-IT210 is a new generation SEM that is compact and can be operated unattended.
Scanning Electron Microscope JEOL JSM-IT710HR
Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's HR* series, which is based on the theme of "SEM that allows anyone to easily take high-resolution images.
The JSM-IT710HR makes users want to pursue beyond what has been seen, due to ease of operation with enhanced automatic functions and improved observation performance from a new detector.
Scanning Electron Microscope JEOL JSM-IT800 Schottky Field Emission
The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" for fast elemental mapping with a fully embedded JEOL energy dispersive X-ray spectrometer (EDS), as a common platform.
