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JEOL : JCM-7000 NeoScope™ Benchtop Scanning Electron Microscope

Optical Image to SEM observation with live Elemental Analysis JCM-7000 is a new benchtop scanning electron microscope with helpful functions.  Low vacuum (LV) mode makes it possible to observe without sample preparation.  Stage Navigation System helps users easily look for the area of interest.  Zeromag provides smooth transition from optical images to SEM images.  Live Analysis enables real-time elemental analysis during observation.  Furthermore, Live 3D gives 3D image restructure simultaneously with the SEM image.  JCM-7000 has incorporated those new functions aiming at “observations and analyses by everyone”. ● Direct magnification: ×10 to ×1,000,000 (Magnification is defined by 128 mm × 96 mm) ● Monitor magnification: ×24 to ×202,168 (Magnification is defined by 280 mm × 210 mm) ● Specimen size: 80 mm diameter ● Main options: EDS (energy dispersive X-ray spectrometer), Stage Navigation System, Tilting and Rotating Motor Drive Holder